UV Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 255-440 nm

20Q20NC.UV
€ 691.00

Description

The 20Q20NC.UV Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 255-440 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

Product Series Overview

UV Broadband Beam Samplers

 

Technical Specs

• Diameter
  50.8 mm  
   
• Antireflection Coating
  255-440 nm
   
• Material
  UV Grade Fused Silica
   
• Surface Quality
  15-5 scratch-dig
   
• Angle of Incidence
  45 °  
   
• Coating Code
  NC.UV
   
• Substrate Number
  10Q20
   
• Surface Flatness
  ≤λ/10 at 632.8 nm over the clear aperture
   
• Durability
  MIL-C-675C, adhesion, abrasion and solubility
   
• Chamfers
  0.25-0.76 mm face width
   

• Chamfers Angle Tolerance
  45° ±15°
   
• Cleaning
  Non-abrasive method, acetone or isopropyl alcohol on lens tissue recommended see Care and Cleaning of Optics
   
• Clear Aperture
  > central 80% of diameter
   
• Damage Threshold
  1.0 J/cm2 with 10 nsec pulses, 10 Hz @ 266 nm, typical
   
• Diameter Tolerance
  +0/-0.13 mm
   
• Wedge
  30 ±15 arc min
   
• Efficiency
  Ravg < 1% @ 255-440 nm
   
• Thickness
  9.4 mm  
   
• Thickness Tolerance
  ±0.38 mm